Research and Markets: Advanced Characterization Techniques for Thin Film Solar Cells - Covering Emerging Techniques in the Field of Photovoltaics

DUBLIN--(BUSINESS WIRE)-- Research and Markets (http://www.researchandmarkets.com/research/d45076/advanced_character) has announced the addition of John Wiley and Sons Ltd's new book "Advanced Characterization Techniques for Thin Film Solar Cells" to their offering.

Written by scientists from leading institutes in Germany, USA and Spain, this text contains concise and comprehensive lecture-like chapters on specific research methods for advanced characterization techniques for thin film solar cells.

This handbook focuses on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, a clear introductory chapter describes the basic physics of thin-film solar cells and modules, providing a guide to the specific advantages that are offered by each individual method.

The choice of subjects is a representative cross-section of those methods enjoying a high degree of visibility in recent scientific literature. Furthermore, the text deals with specific device-related topics and includes a selection of material and surface/interface analysis methods that have recently proven their relevance. Finally, simulation techniques are presented that are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D and 2D.

For students in physics, solid state physicists, materials scientists, PhD students in material sciences, materials institutes, semiconductor physicists, and those working in the semiconductor industry, as well as being suitable as supplementary reading in related courses.

Key Topics Covered Include the Following:

Fundamental Electrical Characterization of Thin-Film Solar Cells (Thomas Kirchartz, Kaining Ding, and Uwe Rau).
Electroluminescence Analysis of Solar Cells and Solar Modules (Thomas Kirchartz, Anke Helbig, Bart E. Pieters, and Uwe Rau).
Capacitance Spectroscopy of Thin-Film Solar Cells (Jennifer Heath and Pawel Zabierowski).
Characterizing the Light-Trapping Properties of Textured Surfaces with Scanning Near-Field Optical Microscopy (Karsten Bittkau).
Spectroscopic Ellipsometry (Sylvain Marsillac, Michelle N. Sestak, Jian Li, and Robert W. Collins).
Photoluminescence Analysis of Thin-Film Solar Cells (Thomas Unold and Levent Gtay).
Ab-Initio Modeling of Defects in Semiconductors (Karsten Albe, Pter goston, and Johan Pohl).

Author:

Daniel Abou-Ras is senior scientist at the Helmholtz Center Berlin for Materials and Energy. He obtained his PhD at ETH Zurich, Switzerland. His research interests are scanning as well as transmission electron microscopy techniques applied on thin-film solar cells.

Thomas Kirchartz is a scientist at the Institute of Energy at the research center in Julich. He obtained his Dipl. Ing. degree from the University of Stuttgart for work on the electroluminescence of solar cells in 2006 and his Dr. Ing. from the RWTH Aachen in 2009 for work on a detailed balance theory of solar cells.

Uwe Rau is full professor at RWTH Aachen (Faculty Electrical Engineering and Computer Science, chair of photovoltaics) since 2007 and is head of the energy research IEF-55 photovoltaic institute at the research center in Julich. He obtained his PhD 1991 from Physical Institute of the University Tubingen (Prof. Huebener) and was scientific group leader from 1995-2007 at the University Bayreuth and Stuttgart.

For more information visit http://www.researchandmarkets.com/research/d45076/advanced_character